Title :
The path to one-picosecond accuracy
Author :
Sartori, Luca ; West, Bumell G.
Author_Institution :
Schlumberger Semicond. Solutions, San Jose, CA, USA
Abstract :
Since 1990, architectural innovations and implementation breakthroughs have driven EPA from ±250 ps to ±50 ps, in a tester with the same waveform capabilities and the same cost per pin. Further progress, called for by new devices all over the application spectrum, is based on tight control of the ATE timing error budget, and addresses the fundamental challenge of source synchronous timing. The path to deep picosecond accuracy is driven by calibration technology
Keywords :
automatic test equipment; calibration; timing; ATE architecture; EPA; calibration technology; source synchronous timing; timing accuracy; Accuracy; Costs; Error correction; Frequency; Integrated circuit modeling; Moore´s Law; Silicon; Technological innovation; Testing; Timing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894256
