Title :
Real time fingerprint identification
Author :
Alam, M.S. ; Akhteruzzaman, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alabama Univ., Tuscaloosa, AL, USA
Abstract :
The pattern matching for fingerprints requires a large amount of data and computation time. Practical fingerprint identification systems require minimal errors and ultrafast processing time to perform real time verification and identification. By utilizing the two-dimensional processing capability, fast processing speed and non-interfering communication of optical processing techniques, such extremely fast real time fingerprint identification systems can be implemented. Among the various pattern matching systems, the joint transform correlator (JTC) has been found to be inherently suitable for real time matching applications. Among the various JTCs the fringe-adjusted JTC has been found to yield significantly better correlation output compared to alternate JTCs. In this paper, a fingerprint identification system has been developed based on the fringe-adjusted JTC. Since all pattern matching systems suffer from high sensitivity to distortions, the synthetic discriminant function concept has been incorporated in fringe-adjusted JTC to ensure distortion-invariant fingerprint identification
Keywords :
computational complexity; feature extraction; fingerprint identification; image matching; real-time systems; distortion-invariance; fingerprint identification; fringe-adjusted JTC; joint transform correlator; minimal errors; optical processing; pattern matching; real time matching; real time verification; synthetic discriminant function; two-dimensional processing; ultrafast processing time; Fingerprint recognition; Glass; Matched filters; Optical attenuators; Optical distortion; Optical filters; Optical refraction; Optical sensors; Pattern matching; Real time systems;
Conference_Titel :
National Aerospace and Electronics Conference, 2000. NAECON 2000. Proceedings of the IEEE 2000
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-6262-4
DOI :
10.1109/NAECON.2000.894943