Title :
A programmable sensor signal conditioning LSI
Author :
Murabayashi, Fumio ; Matsumoto, Masahiro ; Hanzawa, Keiji ; Yamauchi, Tatsumi ; Sakurai, Kouhei ; Yamada, Hiromichi ; Shimada, Satoshi ; Miyazaki, Atsushi
Author_Institution :
Res. Lab., Hitachi Ltd., Ibaraki, Japan
Abstract :
A programmable sensor signal conditioning LSI has a programmable interface circuit to input various signals and has a wide signal range from 10 mV to 2 V. The LSI can calibrate errors of various sensors transfer within 0.5% accuracy in a wide signal range. The signal conditioning LSI has three main modules, that is a sigma-delta AD-converter, a high reliability EPROM, and a 16 bit signal conditioning DSP. The sigma-delta AD-converter has a programmable interface and 10 μV minimum resolution. Information determining the input signal range and calibration data are stored in a high reliability EPROM which has a redundant cell architecture. These modules have been integrated in a 0.8 μm CMOS process and the chip is 4.3 mm×4.7 mm
Keywords :
CMOS integrated circuits; EPROM; calibration; large scale integration; mixed analogue-digital integrated circuits; programmable circuits; sensors; sigma-delta modulation; signal processing equipment; 0.8 micron; 10 mV to 2 V; 16 bit; ADC; ASIC; CMOS process; error calibration; high reliability EPROM; programmable interface circuit; programmable sensor signal conditioning LSI; redundant cell architecture; sigma-delta A/D converter; signal conditioning DSP; Calibration; Circuit noise; Clocks; Delta-sigma modulation; Digital signal processing; EPROM; Electromagnetic interference; Large scale integration; Sensor phenomena and characterization; Temperature sensors;
Conference_Titel :
ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
Conference_Location :
Cheju
Print_ISBN :
0-7803-6470-8
DOI :
10.1109/APASIC.2000.896920
