Title :
Proven single pass design methodology for high reliable VDSM
Author :
Seo, Keun-Ok ; Park, Sancho
Author_Institution :
R&D Div., Davan Tech Co. Ltd., Seoul, South Korea
Abstract :
This paper addresses the Avant! silicon proven single pass design methodology for the recent very deep submicron (VDSM) era. Avant!´s single pass process is a predictable and controllable design process with closure in mind, not only for timing but also for signal/power integrity. By applying the right technology to the root cause of a design problem, this process can generate an optimal result in the shortest time
Keywords :
integrated circuit design; integrated circuit reliability; integrated circuit technology; controllable design process; high reliability very DSM technology; power integrity; signal integrity; single pass design methodology; timing; very deep submicron technology; Circuit synthesis; Databases; Design methodology; Design optimization; Integrated circuit interconnections; Logic; Process design; Research and development; Signal design; Silicon;
Conference_Titel :
ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
Conference_Location :
Cheju
Print_ISBN :
0-7803-6470-8
DOI :
10.1109/APASIC.2000.896959
