Title :
Winner take all experts network for sensor validation
Author :
Yen, Galy G. ; Feng, Wei
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
Abstract :
The validation of sensor measurements has become an integral part of the operation and control of modern industrial equipment. The sensor under a harsh environment must be shown to consistently provide the correct measurements. Analysis of the validation hardware or software should trigger an alarm when the sensor signals deviate appreciably from the correct values. Neural network based models can be used to estimate critical sensor values when neighboring sensor measurements are used as inputs. The discrepancy between the measured and predicted sensor values may then be used as an indicator for sensor health. The proposed winner take all experts (WTAE) network is based on a `divide and conquer´ strategy. It employs a growing fuzzy clustering algorithm to divide a complicated problem into a series of simpler sub-problems and assigns an expert to each of them locally. After the sensor approximation, the outputs from the estimator and the real sensor value are compared both in the time domain and the frequency domain. Three fault indicators are used to provide analytical redundancy to detect the sensor failure. In the decision stage, the intersection of three fuzzy sets accomplishes a decision level fusion, which indicates the confidence level of the sensor health. Two data sets, the Spectra Quest Machinery Fault Simulator data set and the Westland vibration data set, were used in simulations to demonstrate the performance of the proposed WTAE network. The simulation results show the proposed WTAE is competitive with or even superior to the existing approaches
Keywords :
backpropagation; fault diagnosis; fuzzy set theory; industrial control; intelligent control; multilayer perceptrons; observers; pattern clustering; redundancy; sensor fusion; Spectra Quest Machinery Fault Simulator data set; Westland vibration data set; analytical redundancy; confidence level; critical sensor values; decision level fusion; divide and conquer strategy; fault indicators; growing fuzzy clustering algorithm; harsh environment; modern industrial equipment; neural network based models; sensor approximation; sensor failure; sensor health; sensor validation; winner take all experts network; Clustering algorithms; Failure analysis; Fault detection; Frequency domain analysis; Frequency estimation; Hardware; Industrial control; Neural networks; Redundancy; Signal analysis;
Conference_Titel :
Control Applications, 2000. Proceedings of the 2000 IEEE International Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-6562-3
DOI :
10.1109/CCA.2000.897405