DocumentCode :
1740712
Title :
Denoising of Monte Carlo dose distributions
Author :
Deasy, Joseph O.
Author_Institution :
Mallinckrodt Inst. of Radiol., Washington Univ. Sch. of Med., St. Louis, MO, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
1494
Abstract :
The Monte Carlo (MC) method has long been viewed as the ultimate dose distribution computational technique, due to its capability of realistically accounting for underlying physical processes and anatomical information. The inherent stochastic fluctuations (i.e., noise) in the resulting dose distributions, however, have several important effects: noise will affect estimations of all the relevant dosimetric and radiobiological indices; noise degrades the resulting visualizations, e.g. isodose plots, which are used to guide treatment planning; and the noise level dictates the computation time. We ask the question whether it is feasible to introduce a post-processing step which reduces statistical fluctuations in the MC dose distribution. We call this process denoising. It may also be referred to as filtering or smoothing. We present a few limited results for a homogeneous and a step-heterogeneity phantom. Our initial investigations support the hypothesis that denoising of MC dose distributions is, to some degree, feasible
Keywords :
Monte Carlo methods; dosimetry; electron transport theory; fluctuations; image restoration; medical image processing; photon transport theory; radiation therapy; smoothing methods; Monte Carlo dose distributions; denoising; filtering; homogeneous phantom; image restoration; inherent stochastic fluctuations; isodose plots; post-processing step; radiation treatment planning; radiobiological indices; smoothing; step-heterogeneity phantom; Degradation; Distributed computing; Filtering; Fluctuations; Monte Carlo methods; Noise level; Noise reduction; Physics computing; Stochastic resonance; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1094-687X
Print_ISBN :
0-7803-6465-1
Type :
conf
DOI :
10.1109/IEMBS.2000.898025
Filename :
898025
Link To Document :
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