Title :
Nonparametric adaptive importance sampling for rare event simulation
Author :
Kim, Yun Bae ; Roh, Deok Seon ; Lee, Myeong Yong
Author_Institution :
Sch. of Syst. & Manage. Eng., Sung Kyun Kwan Univ., Suwon, South Korea
Abstract :
Simulating rare events in telecommunication networks such as estimation for cell loss probability in asynchronous transfer mode (ATM) networks requires a major simulation effort due to the slight chance of buffer overflow. Importance sampling (IS) is applied to accelerate the occurrence of rare events. Importance sampling depends on a biasing scheme to make the estimator from IS unbiased. Adaptive importance sampling (AIS) employs an estimated sampling distribution of IS to the system of interest during the course of simulation. In this study, we propose a nonparametric adaptive importance sampling (NAIS) technique, a non-parametrically modified version of AIS, and estimate the probability of rare event occurrence in an M/M/1 queueing model. Compared with classical Monte Carlo simulation and AIS, the computational efficiency and variance reductions gained via NAIS are reasonable. A possible extension of NAIS with regards to random number generation is also discussed
Keywords :
asynchronous transfer mode; discrete event simulation; importance sampling; probability; queueing theory; random number generation; telecommunication computing; ATM networks; Monte Carlo simulation; asynchronous transfer mode networks; biasing scheme; buffer overflow; cell loss probability; computational efficiency; nonparametric adaptive importance sampling; queueing model; random number generation; rare event simulation; telecommunication network simulation; Asynchronous transfer mode; Buffer overflow; Computational modeling; Discrete event simulation; Engineering management; Monte Carlo methods; Random number generation; Sampling methods; Systems engineering and theory; Telecommunication network management;
Conference_Titel :
Simulation Conference, 2000. Proceedings. Winter
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-6579-8
DOI :
10.1109/WSC.2000.899849