DocumentCode
1741144
Title
Characteristics of a new parallel plate microchamber explicitly designed for high spatial resolution, Bragg-Gray cavity measurements of small photon beams
Author
Chu, James ; Soen, J.
Volume
3
fYear
2000
fDate
2000
Firstpage
1688
Abstract
A new parallel plate ionization microchamber has been designed to specifically address problems of small beam dosimetry. The chamber´s extremely small, well-defined volume and tissue equivalency, closely approximate ideal Bragg-Gray cavity conditions. This allows the chamber to be used as a theoretically sound measuring tool in regions where electron equilibrium ceases to exist. Results show the parallel plate microchamber to be a simple, reproducible and easy to use device in the measurement of total scatter factors, percent depth doses and off axis ratios. The microchamber demonstrates a decreased volume effect when measuring stereotactic cone output factors. The small well-defined volume of the chamber improves spatial resolution and artificial penumbral broadening when measuring off axis ratios. The small volume of the chamber magnifies the influence of radiation induced cable currents. However with careful experimental technique, this problem can be completely resolved
Keywords
dosimeters; dosimetry; ionisation chambers; radiation therapy; Bragg-Gray cavity measurements; artificial penumbral broadening; decreased volume effect; high spatial resolution; ideal Bragg-Gray cavity conditions; ionization microchamber; off axis ratios; parallel plate microchamber; percent depth doses; radiation induced cable currents; simple reproducible device; small beam dosimetry; small photon beams; stereotactic cone output factors; stereotactic radiosurgery; tissue equivalency; total scatter factors; Acoustic scattering; Detectors; Dosimetry; Electromagnetic scattering; Electrons; Equations; Ionization; Particle scattering; Spatial resolution; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1094-687X
Print_ISBN
0-7803-6465-1
Type
conf
DOI
10.1109/IEMBS.2000.900405
Filename
900405
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