Title :
Noise performance design of preamplifiers for silicon microelectrodes with on-chip electronics
Author :
Kim, Kyung Hwan ; Kim, Sung June
Author_Institution :
Dept. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
A systematic design guideline for the noise performance of preamplifier of the active semiconductor neural probe is presented. Analysis of signal-to-device-noise ratio (SNR) for CMOS source follower buffer and two-stage differential voltage amplifier is given, based on a measured extracellular recording from Aplysia, and 1/f noise spectrum measurement. Important factors having significant effects on the SNR are determined, Analytical expressions of the output noise power are derived and utilized to tailor the parameters controllable by the circuit designer. We show that the output device noise power can be much higher than the output signal power if the devices at the input stage of the preamplifier were made as small as given CMOS fabrication technology permits. Quantitative information of the preamplifier circuit parameters for satisfactory noise performance is provided
Keywords :
1/f noise; CMOS analogue integrated circuits; biomedical electrodes; biomedical electronics; differential amplifiers; elemental semiconductors; integrated circuit noise; microelectrodes; preamplifiers; silicon; 1/f noise spectrum measurement; Aplysia; CMOS source follower buffer; active semiconductor neural probe; extracellular recording; noise performance design; on-chip electronics; output noise power; preamplifiers; signal-to-device-noise ratio; silicon microelectrodes; systematic design guideline; two-stage differential voltage amplifier; Active noise reduction; CMOS technology; Circuit noise; Guidelines; Noise measurement; Preamplifiers; Probes; Semiconductor device noise; Signal to noise ratio; Silicon;
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-6465-1
DOI :
10.1109/IEMBS.2000.900490