• DocumentCode
    1741456
  • Title

    A semi-empirical treatment planning model for optimization of multiprobe cryosurgery

  • Author

    Baissalov, Roustem ; Sandison, George A. ; Donnelly, Bryan J. ; Saliken, John C. ; Muldrew, Ken ; Rewcastle, John

  • Author_Institution
    Dept. of Med. Phys., Tom Baker Cancer Center, Calgary, Alta., Canada
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    714
  • Abstract
    A model is presented for treatment planning of multiprobe cryosurgery. In this model a thermal simulation algorithm is used to generate temperature distribution from cryoprobes, visualize isotherms in the anatomical region of interest, and provide tools to assist estimation of the amount of freezing damage to the target and surrounding normal structures. Calculations may be performed for any given freezing time for the selected set of operation parameters. The thermal simulation is based on solving the transient heat conduction equation using finite element methods for a multiprobe geometry. As an example, a semi-empirical optimization of 2D placement of 6 cryoprobes and their thermal protocol for the first freeze cycle is presented. The effectiveness of the optimized treatment protocol was estimated by generating temperature-volume histograms and calculating the objective function for the anatomy of interest
  • Keywords
    biothermics; low-temperature techniques; modelling; optimisation; patient treatment; surgery; cryoprobes; finite element methods; freeze cycle; isotherm; multiprobe cryosurgery optimization; multiprobe geometry; objective function calculation; operation parameters set; semiempirical treatment planning model; temperature-volume histogram; thermal protocol; transient heat conduction equation; Anatomy; Equations; Finite element methods; Geometry; Histograms; Protocols; Solid modeling; Temperature distribution; Thermal conductivity; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-6465-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.2000.900846
  • Filename
    900846