• DocumentCode
    1741767
  • Title

    Two-photon evanescent wave spectroscopy: a novel technique for exploiting gas-surface dynamics in the boundary layer

  • Author

    Bordo, V.G. ; Loerke, J. ; Rubahn, H.-G.

  • Author_Institution
    Inst. of Gen. Phys., Acad. of Sci., Moscow, Russia
  • fYear
    2000
  • fDate
    12-12 May 2000
  • Firstpage
    45
  • Lastpage
    46
  • Abstract
    Summary form only given. Resonant optics at a gas-solid interface can exhibit unprecedented sensitivity to gas-surface interactions if one restricts the gas volume that determines the optical response to very small distances to the surface. In the case of evanescent wave or surface plasmon spectroscopy the excited gas volume is limited by the depth of the wave penetration into the gas. Due to this fact the corresponding optical spectra are very sensitive to the polarization behavior of the gas near the surface. Because this behavior is different for atoms or molecules moving to the surface compared to those that depart from it, one can distinguish in a spectroscopic manner between the contributions. Of course, this is only possible if a quantitative theoretical description of the experimentally observed line shapes is available. We have developed the corresponding theory previously and have it modified to match the present experimental conditions.
  • Keywords
    fluorescence; interface phenomena; sorption; two-photon spectroscopy; boundary layer; evanescent wave; excited gas volume; gas volume; gas-solid interface; gas-surface dynamics; gas-surface interactions; optical response; optical spectra; polarization behavior; resonant optics; sensitivity; surface plasmon spectroscopy; two-photon evanescent wave spectroscopy; wave penetration; Atomic beams; Fluorescence; Laser excitation; Optical pulses; Optical scattering; Optical sensors; Optical surface waves; Spectroscopy; Surface waves; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    1094-5695
  • Print_ISBN
    1-55752-608-7
  • Type

    conf

  • Filename
    901585