Title :
Observation of sharp photoluminescence lines from self-assembled InGaN quantum dots
Author :
Moriwaki, Osamu ; Someya, Takao ; Tachibana, K. ; Ishida, Shigesuke ; Arakawa, Yasuhiko
Author_Institution :
Center for Adv. Sci. & Tech., Tokyo Univ., Japan
Abstract :
Summary form only given. Growth of GaN-based self-assembled quantum dots (QDs) has received great attention for application to blue light emitting lasers. Lasing action from a photo-excited InGaN QD laser at room temperature was recently reported. To confirm the effect of quantum-mechanically localized states in the QDs, discrete energy levels should be evidenced. However, there has been no report on sharp luminescence lines from GaN-based QDs. We investigate photoluminescence from MOCVD-grown InGaN QDs using micro-PL (/spl mu/-PL) through apertures in a metal mask on the QD sample. Very narrow spectral peaks with the line width of 170 /spl mu/eV were successfully observed. The linewidth is limited by the spectral resolution of the measurement system. This result clearly demonstrates localized excitonic states in the InGaN QDs.
Keywords :
III-V semiconductors; MOCVD coatings; excitons; gallium compounds; indium compounds; interface states; photoluminescence; self-assembly; semiconductor quantum dots; spectral line breadth; GaN-based self-assembled quantum dots; InGaN; InGaN quantum dots; apertures; blue light emitting lasers; discrete energy levels; lasing action; line width; linewidth; localized excitonic states; measurement system; metal mask; microphotoluminescence; photoluminescence; quantum dots; quantum-mechanically localized states; room temperature; self-assembled quantum dots; sharp luminescence lines; sharp photoluminescence lines; spectral peaks; spectral resolution; US Department of Transportation;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-608-7