Title :
Thresholdless intensity fluctuations in a slow-inversion microlaser
Author :
van Druten, N.J. ; Lien, Y. ; Serrat, Carles ; Oemrawsingh, S.S.R. ; van Exter, Martin P. ; Woerdman, J.P.
Author_Institution :
Huygens Lab., Leiden Univ., Netherlands
Abstract :
Summary form only given. There is considerable current interest in microlasers, both from a fundamental and from a practical point of view. The ultimate goal is to have a sufficiently small laser that /spl beta/, the fraction of the spontaneous emission going into the lasing mode, becomes equal to one. When approaching the /spl beta/=1 limit, the usual laser threshold disappears, and such devices are often referred to as "thresholdless" lasers We report experiments, which show a remarkable deviation from conventional behavior. These experiments were performed on short (0.3 mm) Nd:YVO/sub 4/ microchip lasers.
Keywords :
fluctuations; laser modes; laser noise; neodymium; solid lasers; spontaneous emission; yttrium compounds; 0.3 mm; Nd:YVO/sub 4/ microchip lasers; YAG:Nd; YAl5O12:Nd; laser threshold; lasing mode; microlasers; slow-inversion microlaser; small laser; spontaneous emission; thresholdless intensity fluctuations; Equations; Fluctuations; Laser theory; Microchip lasers; Photonic band gap; Polarization;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-608-7