DocumentCode
1741957
Title
Calibration of third-order nonlinear optical susceptibilities via non-phase matched optical third-harmonic generation in noncentrosymmetric media
Author
Bosshard, C. ; Gubler, U. ; Kaatz, P. ; Meier, Uwe ; Gunter, P.
Author_Institution
Nonlinear Opt. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
fYear
2000
fDate
12-12 May 2000
Firstpage
171
Lastpage
172
Abstract
Summary form only given. One of the great challenges in nonlinear optics is the establishment of reliable absolute values of optical nonlinearities. We here show that frequency-tripling in combination with cascaded second-harmonic and sum-frequency-generation is a veri efficient tool to obtain self-consistent reliable reference values for the third-order nonlinear optical susceptibility /spl chi//sup (3)/. We present our experimental results on the crystals KNbO/sub 3/, quartz, and 4-N-N-dimethylamino-4´-N´-methylstilbazolium toluene-p-sulfonate (DAST) and the glasses BK7, SF59, and fused silica with emphasis on the theoretical analysis of the cascaded phenomena including the boundary conditions, reliable reference materials, wavelength dispersion of the third-order susceptibilities, and structure-property relationships.
Keywords
calibration; nonlinear optical susceptibility; optical frequency conversion; optical harmonic generation; 4-N-N-dimethylamino-4´-N´-methylstilbazolium toluene-p-sulfonate; BK9 glass; DAST crystal; KNbO/sub 3/; KNbO/sub 3/ crystal; SF59 glass; SiO/sub 2/; calibration; cascaded phenomena; frequency tripling; fused silica; noncentrosymmetric medium; nonphase matched optical third harmonic generation; quartz crystal; sum frequency generation; third-order nonlinear optical susceptibility; Boundary conditions; Calibration; Crystalline materials; Crystals; Frequency; Glass; Materials reliability; Nonlinear optics; Reliability theory; Silicon compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
Conference_Location
San Francisco, CA, USA
ISSN
1094-5695
Print_ISBN
1-55752-608-7
Type
conf
Filename
901935
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