• DocumentCode
    1741981
  • Title

    Ultrafast X-ray science at the Advanced Light Source

  • Author

    Schoenlin, R.W. ; Chong, H.H.W. ; Glover, T.E. ; Heimann, P.A. ; Shank, C.V. ; Zholents, Alexander ; Zolotorev, M.

  • Author_Institution
    Div. of Mater. Sci., Lawrence Berkeley Lab., CA, USA
  • fYear
    2000
  • fDate
    12-12 May 2000
  • Firstpage
    187
  • Abstract
    Summary form only given. An important frontier in ultrafast research is the application of femtosecond X-ray pulses to investigate structural dynamics associated with phase transitions in solids, chemical reactions and rapid biological processes. The fundamental time scale for such processes is an atomic vibrational period, /spl sim/100 fs. Since X-rays interact with core electronic levels they can provide direct information about atomic structure. X-ray diffraction, extended X-ray absorption fine structure (EXAFS) and related X-ray techniques are widely used at modern synchrotrons providing high-brightness X-ray beams. However, the time resolution available from synchrotrons is nearly three orders of magnitude too slow to probe atomic motion within a single vibrational period. We have recently generated femtosecond synchrotron pulses from the Advanced Light Source (ALS) using ultrashort pulses. Future plans for developing femtosecond X-ray science at the ALS will be discussed.
  • Keywords
    EXAFS; X-ray diffraction; X-ray production; 100 fs; EXAFS; X-ray diffraction; advanced light source; atomic structure; atomic vibrational period; chemical reactions; core electronic levels; direct information; extended X-ray absorption fine structure; femtosecond X-ray pulses; fundamental time scale; high-brightness X-ray beams; phase transitions; rapid biological processes; single vibrational period; solids; structural dynamics; ultrafast X-ray science; ultrafast research; Biological processes; Chemical processes; Electromagnetic wave absorption; Light sources; Probes; Pulse generation; Solids; Synchrotrons; Ultrafast electronics; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2000. (QELS 2000). Technical Digest
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    1094-5695
  • Print_ISBN
    1-55752-608-7
  • Type

    conf

  • Filename
    901960