• DocumentCode
    1742317
  • Title

    Reduction of bias in maximum likelihood ellipse fitting

  • Author

    Matei, Bogdan ; Meer, Peter

  • Author_Institution
    Dept. of Electr. Eng., Rutgers Univ., Piscataway, NJ, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    794
  • Abstract
    An improved maximum likelihood estimator for ellipse fitting based on the heteroscedastic errors-in-variables (HEIV) regression algorithm is proposed. The technique significantly reduces the bias of the parameter estimates present in the direct least squares method, while it is numerically more robust than renormalization, and requires less computations than minimizing the geometric distance with the Levenberg-Marquardt optimization procedure. The HEIV algorithm also provides closed-form expressions for the covariances of the ellipse parameters and corrected data points. The quality of the different solutions is assessed by defining confidence regions in the input domain, either analytically or by bootstrap. The latter approach is exclusively data driven and it is used whenever the expression of the covariance for the estimates is not available
  • Keywords
    convergence; image processing; maximum likelihood estimation; statistical analysis; bias reduction; bootstrap; confidence regions; covariances; heteroscedastic errors-in-variables regression algorithm; maximum likelihood ellipse fitting; Additive noise; Closed-form solution; Covariance matrix; Equations; Least squares methods; Maximum likelihood estimation; Optimization methods; Parameter estimation; Robustness; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2000. Proceedings. 15th International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-0750-6
  • Type

    conf

  • DOI
    10.1109/ICPR.2000.903664
  • Filename
    903664