• DocumentCode
    1742474
  • Title

    Development of environmental friendly (green), thermally enhanced mold compound (TEMC) for advanced packages

  • Author

    Tan, T.H. ; Mogi, N. ; Yeoh, L.P.

  • Author_Institution
    Electron. Devices Mater. Res. Lab. Singapore, Singapore
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    160
  • Lastpage
    166
  • Abstract
    This paper outlines the development and performance of a new series of mold compounds with thermal conductivity (λ) up to 100×10-4 cal/cm·s·C (4.2 W/m·K). The alumina and mixture of aluminum nitride and alumina filled mold compound feature a coefficient of thermal expansion of ~10 ppm/K, low warpage with one-side molded BGAs and good anti-solder cracking performance. Being “green”, these halogen and antimony free encapsulants are able to pass high temperature storage life (HTSL) tests at 175°C for more than 1000 hrs. These features are made possible with use of optimum combinations of a carefully selected filler system (up to ~80vol%), epoxy resin system, latent catalyst and new “green” compound technology. Thermal performance indices such as θja values at board level are currently being measured
  • Keywords
    alumina; aluminium compounds; assembling; ball grid arrays; encapsulation; environmental factors; filled polymers; integrated circuit interconnections; integrated circuit packaging; life testing; moulding; printed circuit testing; soldering; thermal conductivity; thermal expansion; thermal stress cracking; 1000 hr; 175 C; Al2O3; AlN; HTSL tests; TEMC; alumina filled mold compound; aluminum nitride/alumina filled mold compound; anti-solder cracking performance; antimony free encapsulants; board level measurements; coefficient of thermal expansion; environmentally friendly thermally enhanced mold compound; epoxy resin system; filler system; green compound technology; halogen free encapsulants; high temperature storage life tests; latent catalyst; mold compounds; one-side molded BGAs; packages; thermal conductivity; thermal performance indices; thermally enhanced mold compound; warpage; Aluminum nitride; Boron; Ceramics; Conducting materials; Electronic packaging thermal management; Epoxy resins; Polymers; Shape control; Silicon compounds; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6654-9
  • Type

    conf

  • DOI
    10.1109/EMAP.2000.904147
  • Filename
    904147