DocumentCode :
1742512
Title :
Measurement of water evaporation rate from epoxy
Author :
Chong, Iok-Tong ; LAM, David CC ; Tong, Pin
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear :
2000
fDate :
2000
Firstpage :
440
Lastpage :
443
Abstract :
Epoxy based materials are used as encapsulants to enhance the reliability of electronic packages. Epoxy is hygroscopic in nature and absorbs water when exposed to humidity. During solder reflow, the absorbed moisture in the package can generate steam pressure at interfacial defect voids and drive interfacial delamination, leading to popcorn failure of the package. Due to the lack of data, the steam pressure in the defect void has been assumed to be a single valued parameter, normally some fraction of the steam saturation pressure at a convenient temperature in popcorning models. A new experimental and analytical methodology to determine the engineering rate of water evaporation from polymer is described in this paper. The evaporation rate from water saturated epoxy is measured by thermogravimetric analysis (TGA). The experimental results indicate that the conventional estimate of water evaporation was found to overestimate the measured rate by nearly two orders of magnitude. To prevent steam driven delamination and popcorning in electronic packaging, the actual evaporation rate should be used in process design as well as polymer material selection
Keywords :
assembling; delamination; encapsulation; evaporation; integrated circuit measurement; integrated circuit packaging; integrated circuit reliability; moisture; plastic packaging; polymers; reflow soldering; thermal analysis; thermal stress cracking; voids (solid); water; TGA; absorbed moisture; defect void; electronic packages; electronic packaging; encapsulants; engineering rate; epoxy; epoxy based materials; evaporation rate; humidity; hygroscopic nature; interfacial defect voids; interfacial delamination; package popcorn failure; polymer material selection; popcorning models; process design; reliability; solder reflow; steam driven delamination; steam driven popcorning; steam pressure; steam saturation pressure; thermogravimetric analysis; water absorption; water evaporation rate measurement; water saturated epoxy; Delamination; Electronics packaging; Humidity; Lead; Materials reliability; Materials science and technology; Mechanical engineering; Moisture; Polymers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904196
Filename :
904196
Link To Document :
بازگشت