DocumentCode :
1742513
Title :
Revisit of wirebonding on immersion silver-finish board
Author :
Cheung, Y.M. ; Or, S.W. ; Sze, Albert
Author_Institution :
ASM Assembly Autom. Ltd., Kwai Chung, China
fYear :
2000
fDate :
2000
Firstpage :
444
Lastpage :
448
Abstract :
In this article, we evaluated the bondability of aluminum and gold wires on multilayer FR-4 printed circuit board (PCB) with immersion silver finish by using an automatic wedge bonder equipped with ultrasonic transducers operating at a conventional 62 kHz and at a higher frequency of 138 kHz. Very good aluminum bondability was obtained at both bonding frequencies. However, the bonder with transducer at higher frequency provided a larger window for setting the bond power. Its bond points exhibit smaller deformation of the bonding wire, less heel cracking and less metal splash. Tarnishing of the silver finish was observed if the boards were left in the atmosphere for days. XPS analysis revealed an additional layer of sulfur compound on the silver surface. The adverse effect of this layer made wirebonding very difficult and proper board storage was important to maintain good bondability
Keywords :
X-ray photoelectron spectra; aluminium; assembling; deformation; environmental degradation; gold; lead bonding; packaging; printed circuit manufacture; silver; surface treatment; ultrasonic bonding; ultrasonic transducers; 138 kHz; 62 kHz; Ag; Al-Ag; Au-Ag; XPS analysis; aluminum bondability; aluminum wires; automatic wedge bonder; board storage; bond points; bond power setting window; bondability; bonder US transducer; bonding frequencies; bonding wire deformation; gold wires; heel cracking; immersion silver finish; immersion silver-finish board; metal splash; multilayer FR-4 PCB; multilayer FR-4 printed circuit board; operating frequency; silver finish tarnishing; sulfur compound surface layer; ultrasonic transducers; wirebonding; Aluminum; Atmosphere; Bonding; Frequency; Gold; Nonhomogeneous media; Printed circuits; Silver; Ultrasonic transducers; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904197
Filename :
904197
Link To Document :
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