Title :
Moisture diffusion monitoring in globtop encapsulant with microdielectric sensors
Author :
Tong, Winnie ; Teng, Annette
Author_Institution :
EPACK Lab, Hong Kong Univ. of Sci. & Technol., Kowloon, China
Abstract :
Dielectric analysis (DEA) can be an invaluable tool for characterizing the curing properties of polymers used in the electronics industry. It is also useful for moisture diffusion studies of polymer encapsulants. Its main advantage is that it can monitor cure rate or moisture uptake in-situ. The sensor used in this study is a Si chip with metal interdigitated electrodes across a polyimide film. The sensor works with the dielectrometer to monitor changes in ionic conductivity due to the presence of free ions in the polymer. The polymer permittivity was measured while it was curing or absorbing moisture. This microdielectric sensor was applied to compare the properties of globtop materials used in COB products. Good sample preparation by cleaning the sensor surface with solvent was key to preparing defect free samples. The encapsulated sensor was cured for different curing times and placed inside a temperature humidity chamber at 85°C/85 RH% for in-situ testing. The glob top thickness above the die was 100 μm. The results showed an increase in permittivity with moisture uptake. The magnitude of the change in permittivity after equilibration was also related to the total amount of water uptake. This curve, as has been shown by Day et al (1992), is in direct correlation to Fick´s law of diffusion. Sensors encapsulated with voids or delamination in the globtop showed much faster rates of moisture uptake. This paper presents moisture diffusion rates of two globtop materials. The effects of variations in curing time (cure state) and presence of microvoiding on water diffusion rate and changes in amount of moisture uptake are also shown
Keywords :
chip-on-board packaging; delamination; dielectric devices; electric sensing devices; encapsulation; integrated circuit packaging; integrated circuit testing; ionic conductivity; moisture; monitoring; permittivity; polymer films; specimen preparation; surface cleaning; thermal stresses; voids (solid); 100 micron; 85 C; COB products; Fick´s law of diffusion; Si sensor chip; cure rate monitoring; cure state; curing; curing properties; curing time; defect free samples; delamination; dielectric analysis; dielectrometer; electronics industry; encapsulated sensor; glob top thickness; globtop encapsulant; globtop materials; in-situ testing; ionic conductivity; metal interdigitated electrodes; microdielectric sensor; microdielectric sensors; microvoiding; moisture absorption; moisture diffusion; moisture diffusion monitoring; moisture diffusion rates; moisture uptake; moisture uptake monitoring; moisture uptake rate; permittivity; polyimide film; polymer encapsulants; polymer permittivity; polymers; sensor encapsulation; sensor surface cleaning; temperature humidity chamber; voids; water diffusion rate; water uptake; Curing; Data envelopment analysis; Dielectrics; Electronics industry; Moisture; Monitoring; Permittivity; Polymers; Sensor phenomena and characterization; Temperature sensors;
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
DOI :
10.1109/EMAP.2000.904200