DocumentCode :
1742517
Title :
Enhancement of moisture sensitivity performance of a FBGA
Author :
Kheng, Lee Teck ; Chai, Lee Kian ; Ming, Chai Yih ; Hong, Ng Yew
Author_Institution :
Package Design & Mater. Group, Micron Semicond. Asia Pte. Ltd., Singapore
fYear :
2000
fDate :
2000
Firstpage :
470
Lastpage :
475
Abstract :
One of the main package reliability limitations of fine pitch BGA (FBGA) is its moisture sensitivity performance, i.e. popcorn failure. Package reliability of different packaging materials is thus normally employed to determine the optimal material combination for good moisture performance. This paper attempts to understand the impact of solder mask design on the package moisture sensitivity. It also determines the die attach adhesion strength material and mold compound selection criteria. By correlating the shear strength to package moisture sensitivity performance, it provides an approach for selecting die attach materials that will enhance the moisture resistance of the package
Keywords :
adhesion; ball grid arrays; encapsulation; fine-pitch technology; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; masks; microassembling; moisture; moulding; sensitivity; shear strength; soldering; FBGA; die attach adhesion strength; die attach materials; fine pitch BGA; material selection criteria; moisture performance; moisture resistance; moisture sensitivity performance; mold compound selection criteria; optimal material combination; package moisture sensitivity; package reliability; package reliability limitations; packaging materials; popcorn failure; shear strength; solder mask design; Adhesives; Assembly; Electronics packaging; Materials reliability; Microassembly; Moisture; Plasma applications; Semiconductor device packaging; Semiconductor materials; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904201
Filename :
904201
Link To Document :
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