DocumentCode :
1742914
Title :
Measuring the complexity of classification problems
Author :
Ho, Tin Kam ; Basu, Mitra
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
43
Abstract :
We study a number of measures that characterize the difficulty of a classification problem. We compare a set of real world problems to random combinations of points in this measurement space and found that real problems contain structures that are significantly different from the random sets. Distribution of problems in this space reveals that there exist at least two independent factors affecting a problem´s difficulty, and that they have notable joint effects. We suggest using this space to describe a classifier domain of competence. This can guide static and dynamic selection of classifiers for specific problems as well as sub-problems formed by confinement, projections, and transformations of the feature vectors
Keywords :
feature extraction; learning (artificial intelligence); pattern classification; statistical analysis; feature vectors; learning; pattern classification; statistical analysis; Computer errors; Error analysis; Extraterrestrial measurements; Failure analysis; Pattern analysis; Pattern recognition; Performance analysis; Stochastic processes; Tin; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.906015
Filename :
906015
Link To Document :
بازگشت