Storage capacity of the exponential correlation associative memory

We analyze the pattern storage capacity of the exponential correlation associative memory (ECAM). We model the performance of the ECAM when presented with corrupted input patterns. Our model leads to an expression for the storage capacity of the ECAM both in terms of the length of the bit-patterns and the probability of bit-corruption in the original input patterns. These storage capacities agree closely with simulation. In addition, our results show that slightly superior performance can be obtained by selecting an optimal value of the exponential constant