DocumentCode :
1743032
Title :
Random embedding machines for low-complexity pattern recognition
Author :
Baram, Yoram
Author_Institution :
Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
748
Abstract :
It is shown that, under a local clustering condition, a set of points of a given class, embedded in binary space by a set of randomly parameterized surfaces, is linearly separable from other classes, with arbitrarily high probability. We call such a data set a local relative cluster. The size of the embedding set is linear in the input dimension and inversely proportional to the squared local clustering degree. A simple parameterization by embedding hyperplanes leads to the separation of multi-cluster data by a network with two internal layers. The computational complexity is linear in the number of relative clusters in the data. This represents a considerable reduction of the learning problem with respect to known techniques, resolving a long-standing question on the complexity of random embedding. Numerical tests show that the proposed method performs as well as state-of the-art methods, in a small fraction of the time
Keywords :
computational complexity; embedded systems; learning (artificial intelligence); neural nets; pattern recognition; probability; clustering; computational complexity; learning; neural nets; parameterization; pattern recognition; probability; random embedding machines; set theory; Artificial neural networks; Computational complexity; Computer science; Embedded computing; Neural networks; Pattern recognition; Performance evaluation; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.906183
Filename :
906183
Link To Document :
بازگشت