Title :
Analysis of ACA/ACF package using equivalent spring method
Author :
Chiang, K.N. ; Chang, C.W. ; Lin, J.D.
Author_Institution :
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Flip-chip-on-glass (FCOG) assembly technology using anisotropic conductive film (ACF) is being developed for fine pitch interconnections between driver ICs and flat panel displays. Conductive adhesives offer advantages in terms of fine-pitch capability and environmental compatibility. Anisotropic conductive films (ACF) are composed of adhesive resin and conductive particles, such as metallic or metal-coated polymer particles. Unlike solder type flip chip interconnection, electric current passing through conductive particles becomes the dominant conduction path. Interconnections between the particles and conductive surfaces are constructed by elastic/plastic deformation of conductive particles with contact pressure, which is maintained by tensile stress in the adhesive. Loss of electric contact can occur when the adhesive expands or swells in the Z-axis direction, but delamination and cracking can occur in the adhesive layer when the tensile stress is excessive. Process simulations and reliability modeling are performed, and nonlinear finite element simulations are used to study the contact force developed and relaxed within the interconnect during processing and environmental effects such as high temperature thermal loading. In addition, a parametric study was also performed. For better performance and reliability, variables such as ACF materials and processing conditions are discussed. Furthermore, a novel method called the equivalent spring method is developed; this methodology could significantly reduce the analysis CPU time and make ACA/ACF process modeling and contact analysis possible
Keywords :
adhesives; chip-on-board packaging; conducting polymers; delamination; driver circuits; elastic deformation; filled polymers; fine-pitch technology; finite element analysis; flat panel displays; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; internal stresses; liquid crystal displays; microassembling; plastic deformation; ACA/ACF package; ACA/ACF process modeling; ACF materials; FCOG assembly technology; adhesive; adhesive expansion; adhesive layer; adhesive resin; analysis CPU time; anisotropic conductive film; anisotropic conductive films; conductive adhesives; conductive particles; contact analysis; contact force; contact force relaxation; contact pressure; cracking; delamination; dominant conduction path; driver ICs; elastic/plastic deformation; electric contact loss; electric current; environmental compatibility; environmental effects; equivalent spring method; fine pitch interconnections; fine-pitch capability; flat panel displays; flip-chip-on-glass assembly technology; high temperature thermal loading; metal-coated polymer particles; metallic particles; nonlinear finite element simulations; particle-conductive surface interconnection; process simulation; processing conditions; reliability; reliability modeling; solder type flip chip interconnection; tensile stress; Anisotropic conductive films; Assembly; Conductive adhesives; Flat panel displays; Packaging; Polymer films; Resins; Springs; Tensile stress; Thermal force;
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
DOI :
10.1109/EPTC.2000.906358