Title :
All-optical bit pattern generation and matching at 10 Gbit/s
Author :
Hall, K.L. ; Rauschenbach, K.A.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
fDate :
25 Feb.-1 March 1996
Abstract :
Summary form only given. In conclusion we have demonstrated all-optical pattern generation and matching at 10 Gbit/s. We have employed a fiber loop memory as the pattern generator and a (nonlinear optical loop mirror) NOLM-based XOR gate as the optical matching circuit. We have demonstrated a contrast ratio greater than 20:1 in a dual input XOR gate. We believe this system will be useful for testing novel, high-speed optical components.
Keywords :
high-speed optical techniques; logic gates; mirrors; nonlinear optics; optical fibres; optical logic; optical storage; optical testing; pattern matching; NOLM-based XOR gate; all-optical bit pattern generation; all-optical bit pattern matching; contrast ratio; fiber loop memory; high-speed optical component testing; nonlinear optical loop mirror; optical matching circuit; pattern generator; Circuit testing; Electronic equipment testing; Electrons; Fiber nonlinear optics; Nonlinear optical devices; Nonlinear optics; Optical fiber couplers; Optical fiber polarization; Optical filters; Pattern matching;
Conference_Titel :
Optical Fiber Communications, 1996. OFC '96
Print_ISBN :
1-55752-422-X
DOI :
10.1109/OFC.1996.907705
