DocumentCode
1743436
Title
The effects of airborne contaminants on electronic power supplies
Author
Cirolia, Frank ; Finan, Christopher
Author_Institution
Ascom Energy Syst., Palm Coast, FL, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
238
Abstract
An often overlooked but nonetheless critical factor in the performance and reliability of electronic power supplies is the purity of the operating environment and cooling air. Even environments typically considered “clean” contain dust, soot, gases and salt. Additionally, varying levels of humidity and condensation must be taken into consideration, both alone and in combination with contaminants. This article explores the numerous negative effects of contamination, focusing primarily on the effect on thermal management characteristics and the degradation of electrical performance. Using existing Ascom products as “case studies”, conclusions may be drawn regarding the effect of contaminants on life expectancy and failure rates. The authors illustrate how traditionally calculated MTBF numbers may be invalid if the cleanliness of the operating environment is not adequately addressed. Finally, they look at design and manufacturing solutions that may be implemented to reduce the harmful effects of contamination
Keywords
air pollution; circuit reliability; failure analysis; power supplies to apparatus; power supply circuits; thermal management (packaging); MTBF; airborne contaminants effects; case studies; cleanliness; condensation; contamination; cooling air; design; electronic power supplies; failure rates; humidity; life expectancy; manufacturing; operating environment; performance; reliability; thermal management characteristics; Atmosphere; Conductors; Contamination; Corrosion; Electronic packaging thermal management; Manufacturing; Power supplies; Power system reliability; Thermal degradation; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-6618-2
Type
conf
DOI
10.1109/APEC.2001.911654
Filename
911654
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