DocumentCode
174349
Title
FS-SDS: Feature selection for JPEG steganalysis using stochastic diffusion search
Author
Bedi, Punam ; Bhasin, Veenu ; Mittal, Natasha ; Chatterjee, Trisha
Author_Institution
Dept. of Comput. Sci., Univ. of Delhi, New Delhi, India
fYear
2014
fDate
5-8 Oct. 2014
Firstpage
3797
Lastpage
3802
Abstract
Feature extraction and classification based on feature sets are two major components of steganalysis process. The high dimension of feature sets used for steganalysis makes classification a complex and time-consuming process. This paper proposes a novel feature selection algorithm (FS-SDS) for steganalysis. FS-SDS is a wrapper-type feature selection algorithm which selects reduced feature set using Stochastic Diffusion Search. The Stochastic Diffusion Search is a generic population-based search method, which has been adopted successfully in this work for steganalytic feature selection. The experiments are conducted with steganograms of the common JPEG steganography techniques. To show the usefulness and effectiveness of FS-SDS, experiments were conducted on two different feature sets used for steganalysis. The experimental results show that the proposed feature selection not only effectively reduces the dimensionality of the features, but also improves the detection accuracy of the steganalysis process.
Keywords
feature extraction; feature selection; image classification; image coding; search problems; steganography; stochastic processes; FS-SDS; JPEG steganalysis; JPEG steganography techniques; classification; feature extraction; feature sets; features dimensionality; generic population-based search method; steganalysis process; steganalytic feature selection; steganograms; stochastic diffusion search; wrapper-type feature selection algorithm; Accuracy; Bismuth; Classification algorithms; Feature extraction; Stochastic processes; Transform coding; Stochastic Diffusion Search; feature selection; steganalysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics (SMC), 2014 IEEE International Conference on
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/SMC.2014.6974522
Filename
6974522
Link To Document