• DocumentCode
    1744003
  • Title

    Thick-films beyond the 1 GHz barrier

  • Author

    Dziurdzia, Barbara ; Nowak, Stanblaw

  • Author_Institution
    Dept. of Electron., Univ. of Min. & Metall., Cracow, Poland
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    31
  • Abstract
    Thick-film technology has shown significant progress in interconnection density using photopatterning technology, lower dielectric constant and lower loss dielectrics, higher conductivity conductors and buried resistors and capacitors integral with the substrate. These advances coupled with thermal and reliability advantages of thick-films have created a new generation of thick-film technology suitable for many microwave designs. The paper reviews new thick-film materials and processes developed to extend the capability of conventional MCM-C technology in microwave applications
  • Keywords
    microwave technology; thick film capacitors; thick film resistors; MCM-C technology; buried resistors; dielectric constant; higher conductivity conductors; integral capacitors; interconnection density; lower loss dielectrics; microwave applications; photopatterning technology; substrate; thick-film technology; Capacitors; Conducting materials; Conductivity; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric substrates; Microwave generation; Microwave technology; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    83-906662-3-5
  • Type

    conf

  • DOI
    10.1109/MIKON.2000.913868
  • Filename
    913868