Title :
Measurements of susceptibility due to paramagnetic impurities in sapphire using whispering gallery modes
Author :
Mann, A.G. ; Krupka, J.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
Abstract :
The microwave susceptibility due to paramagnetic impurities in monocrystalline sapphire has been evaluated based on measurements of the resonant frequency shifts of several whispering gallery modes (WGM) from the normal to the saturated spin state. Spin saturation was achieved by employing a microwave source at a frequency close to the frequency of electron spin resonance for the specific paramagnetic ions. The microwave susceptibility due to the presence of Cr+3 ions was measured and it proved to be highly anisotropic having the dominant component in the plane perpendicular to the anisotropy axis (C-axis) of sapphire crystal
Keywords :
frequency measurement; magnetic impurities; magnetic susceptibility; paramagnetic resonance; sapphire; WGM; electron spin resonance; microwave susceptibility; monocrystalline sapphire; paramagnetic impurities; resonant frequency shift measurement; saturated spin state; spin saturation; susceptibility measurement; whispering gallery modes; Anisotropic magnetoresistance; Frequency measurement; Impurities; Magnetic resonance; Microwave measurements; Paramagnetic materials; Paramagnetic resonance; Resonant frequency; Temperature dependence; Whispering gallery modes;
Conference_Titel :
Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
83-906662-3-5
DOI :
10.1109/MIKON.2000.913960
