Measurements of susceptibility due to paramagnetic impurities in sapphire using whispering gallery modes

Author

Mann, A.G. ; Krupka, J.

Author_Institution

Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia

Volume

2

fYear

2000

fDate

2000

Firstpage

421

Abstract

The microwave susceptibility due to paramagnetic impurities in monocrystalline sapphire has been evaluated based on measurements of the resonant frequency shifts of several whispering gallery modes (WGM) from the normal to the saturated spin state. Spin saturation was achieved by employing a microwave source at a frequency close to the frequency of electron spin resonance for the specific paramagnetic ions. The microwave susceptibility due to the presence of Cr⁺³ ions was measured and it proved to be highly anisotropic having the dominant component in the plane perpendicular to the anisotropy axis (C-axis) of sapphire crystal

Keywords

frequency measurement; magnetic impurities; magnetic susceptibility; paramagnetic resonance; sapphire; WGM; electron spin resonance; microwave susceptibility; monocrystalline sapphire; paramagnetic impurities; resonant frequency shift measurement; saturated spin state; spin saturation; susceptibility measurement; whispering gallery modes; Anisotropic magnetoresistance; Frequency measurement; Impurities; Magnetic resonance; Microwave measurements; Paramagnetic materials; Paramagnetic resonance; Resonant frequency; Temperature dependence; Whispering gallery modes;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on

Conference_Location

Wroclaw

Print_ISBN

83-906662-3-5

Type

conf

DOI

10.1109/MIKON.2000.913960

Filename

913960