Lowering the uncertainty in fast noise measurement procedures

Author

Acciari, G. ; Giannini, F. ; Limiti, E. ; Saggio, G.

Author_Institution

Dipartimento di Ingegneria Elettronica, Rome Univ., Italy

Volume

2

fYear

2000

fDate

2000

Firstpage

531

Abstract

To completely characterise the noise behaviour of a two port device, four noise parameters F_min, R_n, G_opt and B_opt must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 μm δ-doped HEMT devices by Alenia, demonstrating that the common hot-cold measurement procedure can result in an error confidence as low as 0.2% for all the noise parameters

Keywords

electric noise measurement; high electron mobility transistors; measurement errors; two-port networks; 0.3 mum; Alenia; HEMT devices; connection repeatability; fast noise measurement procedures; hot-cold measurement procedure; instrument precision; measurement errors; noise parameters; two port device; uncertainty; Admittance; Circuit noise; Measurement errors; Measurement standards; Noise figure; Noise measurement; Redundancy; Software measurement; Time measurement; Tuners;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on

Conference_Location

Wroclaw

Print_ISBN

83-906662-3-5

Type

conf

DOI

10.1109/MIKON.2000.913988

Filename

913988