DocumentCode :
1744286
Title :
Exact fault simulation for systems on silicon that protects each core´s intellectual property (IP)
Author :
Quasem, Md Saffat ; Gupta, Sandeep K.
Author_Institution :
Univ. of Southern California, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
804
Abstract :
We present a fault simulation approach for multicore systems on silicon (SOC) (a) that provides exact fault coverage for the entire SOC, (b) does so without revealing any intellectual property (IP) of core vendors, and (c) whose run time is comparable to that required by the existing approaches that require all IP to be revealed. This fault simulator assumes a full scan SOC design and is first in a suite of simulation, test generation, and DFT tools that are currently under development. The proposed approach allows flexibility in selection of a test methodology for SOC, reduces test application cost and area and performance overheads, and allows more comprehensive testing
Keywords :
application specific integrated circuits; automatic test pattern generation; fault simulation; industrial property; logic testing; area overheads; exact fault simulation; fault coverage; intellectual property; multicore systems; performance overheads; run time; test application cost; test generation; test methodology; Application software; Circuit faults; Circuit testing; Design automation; Discrete event simulation; Fault diagnosis; Intellectual property; Logic testing; Protection; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
ISSN :
1530-1591
Print_ISBN :
0-7695-0993-2
Type :
conf
DOI :
10.1109/DATE.2001.915130
Filename :
915130
Link To Document :
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