• DocumentCode
    1744286
  • Title

    Exact fault simulation for systems on silicon that protects each core´s intellectual property (IP)

  • Author

    Quasem, Md Saffat ; Gupta, Sandeep K.

  • Author_Institution
    Univ. of Southern California, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    804
  • Abstract
    We present a fault simulation approach for multicore systems on silicon (SOC) (a) that provides exact fault coverage for the entire SOC, (b) does so without revealing any intellectual property (IP) of core vendors, and (c) whose run time is comparable to that required by the existing approaches that require all IP to be revealed. This fault simulator assumes a full scan SOC design and is first in a suite of simulation, test generation, and DFT tools that are currently under development. The proposed approach allows flexibility in selection of a test methodology for SOC, reduces test application cost and area and performance overheads, and allows more comprehensive testing
  • Keywords
    application specific integrated circuits; automatic test pattern generation; fault simulation; industrial property; logic testing; area overheads; exact fault simulation; fault coverage; intellectual property; multicore systems; performance overheads; run time; test application cost; test generation; test methodology; Application software; Circuit faults; Circuit testing; Design automation; Discrete event simulation; Fault diagnosis; Intellectual property; Logic testing; Protection; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
  • Conference_Location
    Munich
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-0993-2
  • Type

    conf

  • DOI
    10.1109/DATE.2001.915130
  • Filename
    915130