DocumentCode
1744286
Title
Exact fault simulation for systems on silicon that protects each core´s intellectual property (IP)
Author
Quasem, Md Saffat ; Gupta, Sandeep K.
Author_Institution
Univ. of Southern California, CA, USA
fYear
2001
fDate
2001
Firstpage
804
Abstract
We present a fault simulation approach for multicore systems on silicon (SOC) (a) that provides exact fault coverage for the entire SOC, (b) does so without revealing any intellectual property (IP) of core vendors, and (c) whose run time is comparable to that required by the existing approaches that require all IP to be revealed. This fault simulator assumes a full scan SOC design and is first in a suite of simulation, test generation, and DFT tools that are currently under development. The proposed approach allows flexibility in selection of a test methodology for SOC, reduces test application cost and area and performance overheads, and allows more comprehensive testing
Keywords
application specific integrated circuits; automatic test pattern generation; fault simulation; industrial property; logic testing; area overheads; exact fault simulation; fault coverage; intellectual property; multicore systems; performance overheads; run time; test application cost; test generation; test methodology; Application software; Circuit faults; Circuit testing; Design automation; Discrete event simulation; Fault diagnosis; Intellectual property; Logic testing; Protection; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location
Munich
ISSN
1530-1591
Print_ISBN
0-7695-0993-2
Type
conf
DOI
10.1109/DATE.2001.915130
Filename
915130
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