DocumentCode
1744295
Title
Large area Apollo(R) module performance and reliability
Author
Cunningham, D. ; Davies, K. ; Grammond, L. ; Mopas, E. ; Connor, N.O. ; Rubcich, M. ; Sadeghi, M. ; Skinner, D. ; Trumbly, T.
Author_Institution
BP Solar, Fairfield, CA, USA
fYear
2000
fDate
2000
Firstpage
13
Lastpage
18
Abstract
This paper describes the work performed at BP Solar, Fairfield, California highlighting advances in the Apollo(R) CdTe technology. The paper describes the eight basic process steps involved in making the module. The state of the art CdTe reactor is also detailed with its sophisticated design and control features. Various techniques were utilized to characterize the semiconductor materials. Using AFM and X-ray diffraction, the morphology and crystallographic properties of the films were investigated. This work showed the grain structure was small, even after post deposition air anneals. Optical characterization determined quantum efficiency of the device and helped optimize window layer thickness for record performances. NREL confirmed module efficiency of 10.8% is reported for a 0.55m2 module and a maximum power of 91.5 W for a 0.94m2 monolithic module. Indoor stress testing and outdoor performance test beds are also described. The data presented shows good indoor stability at various stress conditions
Keywords
II-VI semiconductors; X-ray diffraction; atomic force microscopy; cadmium compounds; crystal microstructure; crystal morphology; optical properties; reliability; semiconductor thin films; solar cell arrays; 10.8 percent; 91.5 W; AFM; Apollo CdTe technology; BP Solar; NREL; X-ray diffraction; crystallographic properties; efficiency; grain structure; indoor stability; indoor stress testing; morphology; optical characterization; outdoor performance test beds; post deposition air anneal; quantum efficiency; semiconductor materials; state of the art CdTe reactor; stress conditions; window layer thickness optimisation; Crystallography; Inductors; Morphology; Optical diffraction; Optical films; Semiconductor films; Semiconductor materials; Stress; Testing; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.915743
Filename
915743
Link To Document