DocumentCode :
1744311
Title :
A novel method for determining bulk diffusion length in bifacial silicon solar cells
Author :
Kreinin, Lev ; Bordin, Ninel ; Eisenberg, Naftali
Author_Institution :
Jerusalem Coll. of Technol., Israel
fYear :
2000
fDate :
2000
Firstpage :
248
Lastpage :
251
Abstract :
In contrast with the usual methods using Q(λ) with back illumination to determine the bulk diffusion length L in bifacial solar cells, the proposed method determines the actual parameters of the back doped layer and also an absolute, not differential L which is usually dependant on irradiance level. The experimental data needed are: Q(λ) measured at low irradiance, and Isc, measured at high irradiance of known spectral distribution. The essence of the method is the determination at low irradiance of the recombination parameters of the base region and the back doped layer by comparison of calculated and experimental Q(λ) data and use of these parameters (except L) with L as a variable to calculate Q(λ) at high irradiance. The agreement of the measured Isc and that calculated by integration of Q(λ) over the light spectrum yields the correct value of L
Keywords :
carrier lifetime; elemental semiconductors; minority carriers; silicon; solar cells; Q(λ); Si; back doped layer; bifacial silicon solar cells; bulk diffusion length determination; high irradiance; low irradiance; short circuit current; spectral distribution; Absorption; Educational institutions; Equations; Length measurement; Lighting; Photovoltaic cells; Radiative recombination; Silicon; Uncertainty; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.915804
Filename :
915804
Link To Document :
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