DocumentCode :
1744376
Title :
Radiation induced defects in Cu(In,Ga)Se2 solar cells-comparison of electron and proton irradiation
Author :
Rau, U. ; Jasenek, A. ; Schock, H.W. ; Werner, J.H. ; Roche, G. La ; Robben, A. ; Bogus, K.
Author_Institution :
Inst. fur Phys. Elektronik, Stuttgart Univ., Germany
fYear :
2000
fDate :
2000
Firstpage :
1032
Lastpage :
1037
Abstract :
The authors report on irradiation experiments of ZnO/CdS/Cu(In,Ga)Se2 heterojunction solar cells with high doses of 1 MeV electrons, 10 MeV (omni-directional) and 4 MeV (uni-directional) protons. Electron irradiation up to 1018 cm -2 is necessary to cause a power conversion efficiency loss of 20-30%. Electrical analysis of irradiated devices shows that the degradation is essentially due to the introduction of (relatively shallow) acceptor-like defects by a rate of approximately 0.02 cm-1 . The decrease of effective doping density is quantified by a rate of 0.045 cm-1. The degradation upon irradiation with 10 MeV (4 MeV) omni- (uni-)directional proton starts at fluences of 1013 cm-2 (1012 cm-2). The remaining efficiency factor is 50% after a 4 MeV-proton fluence of 1014 cm-2. Proton irradiation affects the open circuit voltage and the fill factor. All irradiated samples exhibit a continuous recovery at room temperature
Keywords :
copper compounds; crystal defects; electron beam effects; gallium compounds; indium compounds; proton effects; semiconductor device measurement; semiconductor device testing; solar cells; 1 MeV; 10 MeV; 4 MeV; Cu(In,Ga)Se2 solar cells; Cu(InGa)Se2; ZnO-CdS-Cu(InGa)Se2; acceptor-like defects; continuous recovery; doping density; efficiency factor; electrical analysis; electron irradiation; fill factor; open circuit voltage; power conversion efficiency loss; proton irradiation; radiation induced defects; Circuits; Degradation; Doping; Electrons; Heterojunctions; Photovoltaic cells; Power conversion; Protons; Voltage; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.916063
Filename :
916063
Link To Document :
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