DocumentCode :
1744468
Title :
No-clean assembly process conditions-effects on flip-chip/underfill reliability
Author :
Todd, Michael ; Costello, Kathryn
Author_Institution :
Dexter Electron. Mater. Ind., Industry, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
42
Lastpage :
45
Abstract :
No-clean flux chemistries are gaining acceptance in many high volume SMT manufacturing processes worldwide. These materials offer advantages in manufacturing efficiencies by reducing overall manufacturing cycle time and reducing in-process inventories. The use of no-clean flux materials also eliminates potential environmentally dangerous cleaning solvents from the manufacturing environment (McCurdie, 2000). Dozens of no-clean flux formulations are now available from leading manufacturers based on both natural and synthetic chemistries. The impact of these materials, however, on product reliability must be assessed prior to acceptance. No-clean flux residues have been shown to affect, for example, the physical properties of epoxy underfill materials (Bacher and Kirkpatrick, 1999) as well as the long-term reliability characteristics of flip-chip assemblies (Todd, 2000). A series of experiments was conducted to identify the effects of key manufacturing process variable changes on the performance of flip chip underfill materials in a no-clean flux flip-chip assembly. The manufacturing process variables evaluated were: no-clean flux chemistry type; reflow profile; underfill dispense temperature
Keywords :
encapsulation; environmental factors; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; microassembling; printed circuit manufacture; reflow soldering; surface contamination; surface mount technology; environmentally dangerous cleaning solvents; epoxy underfill materials; flip chip underfill materials; flip-chip assemblies; flip-chip/underfill reliability; in-process inventories; long-term reliability characteristics; manufacturing cycle time; manufacturing efficiency; manufacturing environment; manufacturing process variable changes; manufacturing process variables; natural flux chemistries; no-clean assembly process conditions; no-clean flux chemistries; no-clean flux chemistry; no-clean flux flip-chip assembly; no-clean flux formulations; no-clean flux materials; no-clean flux residues; physical properties; product reliability; reflow profile; synthetic flux chemistries; underfill dispense temperature; volume SMT manufacturing processes; Assembly; Chemistry; Cleaning; Conducting materials; Flip chip; Manufacturing processes; Materials reliability; Solvents; Surface-mount technology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-64-5
Type :
conf
DOI :
10.1109/ISAOM.2001.916546
Filename :
916546
Link To Document :
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