DocumentCode :
1744473
Title :
Effective applications of computer-vision techniques in packaging design concept evaluation
Author :
Lu, Hua ; Zhou, Jesse
Author_Institution :
Dept. of Mech. Eng., Ryerson Polytech. Univ., Toronto, Ont., Canada
fYear :
2001
fDate :
2001
Firstpage :
207
Lastpage :
212
Abstract :
In packaging design concept verification, interpretations of data obtained from test vehicles are preferably supported by physics based analysis. This is vital when correlation between the thermal/mechanical test data and results from accelerated life testing is sought in order to predict the service life of a prototype. A proposed approach that integrates experimental and analytical procedures has been devised for such analyses. A feature of the approach is the wide variety of the measured data. Other than the test parameters, the approach collects temperature and time dependent deformation data at board, component and interconnect levels. Measurements in this work include surface warpage, in-plane displacements, rigid-body rotation and strains, assembling or residual stress/strain, failure loads and strength limits, etc. From the raw data, further quantities were deduced by applying the theories of beams/plates and material constitutive relations to further enrich the database. Inferred data include surface curvature, cross-sectional bending moment and shearing force, stress, strain rate and strain energy density, etc. The data variety allows better confirmation of the consistency among test results obtained with different techniques. It also facilitates applications of different theories for life prediction and failure mode and root-cause diagnosis. The comparison of different model predictions for same problem is aimed to provide a guide to the reliability model selection and application. This paper presents the experimental and analytical procedures together with some application examples to illustrate the approach
Keywords :
assembling; bending; circuit reliability; computer vision; design engineering; failure analysis; mechanical testing; packaging; printed circuit testing; stress-strain relations; thermal analysis; accelerated life testing; analytical procedures; assembling stress/strain; beam theory; board level deformation; component level deformation; computer-vision techniques; cross-sectional bending moment; data interpretation; design concept verification; failure loads; failure mode diagnosis; failure root-cause diagnosis; in-plane displacements; interconnect level deformation; life prediction; material constitutive relations; measured data; model predictions; packaging design concept evaluation; packaging design concept verification; physics based analysis; plate theory; prototype service life; reliability model selection; residual stress/strain; rigid-body rotation; rigid-body strains; shearing force; strain energy density; strain rate; strength limits; stress; surface curvature; surface warpage; temperature dependent deformation; test consistency; test parameters; test vehicles; thermal cycling life tests; thermal/mechanical test data; time dependent deformation; Application software; Capacitive sensors; Computer applications; Life testing; Packaging; Physics; Predictive models; Residual stresses; Strain measurement; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2001. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-64-5
Type :
conf
DOI :
10.1109/ISAOM.2001.916576
Filename :
916576
Link To Document :
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