Use of the oscillation based built-in self-test method for smart sensor devices

Author

Hodge, A. ; Newcomb, R. ; Hefner, A.

Author_Institution

Div. of Semicond. Electron., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

2

fYear

2001

fDate

6-9 May 2001

Firstpage

281

Abstract

An oscillation-based built-in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming a static analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key metrology infrastructure issues needed for developing the design reuse approach for multi-technology System-on-a-Chip (SoC) devices

Keywords

analogue-digital conversion; automatic testing; biosensors; built-in self test; circuit oscillations; integrated circuit testing; intelligent sensors; mixed analogue-digital integrated circuits; ADCs; ASIC; analog-to-digital converters; built-in self-test method; design reuse approach; digital clock-like signal; functional testing; metrology infrastructure issues; mixed signal devices; multi-technology SoC devices; onchip testing; oscillation-based BIST method; smart biosensor; smart sensor devices; static analog signal conversion; system-on-a-chip devices; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Integrated circuit technology; Integrated circuit testing; Intelligent sensors; Metrology; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6685-9

Type

conf

DOI

10.1109/ISCAS.2001.921062

Filename

921062