DocumentCode
1744977
Title
DC tolerance analysis of electronic circuits by linear programming techniques
Author
Pastore, Stefano ; Premoli, Amedeo
Author_Institution
Dipartimento di Elettrotecnica Elettronica ed Inf., Trieste Univ., Italy
Volume
3
fYear
2001
fDate
6-9 May 2001
Firstpage
369
Abstract
The real equilibrium points of electronic circuits are affected by the deviation of the real characteristics of devices from the nominal ones. We present a method to determine all the “equilibrium regions” in which real equilibrium points may fall. The analysis is based on the “spread characteristics” representing the devices affected by tolerances and on the concept of “certain/uncertain” equilibrium regions. The algorithum exploits Linear Programming Techniques
Keywords
linear programming; nonlinear network analysis; piecewise linear techniques; tolerance analysis; DC tolerance analysis; PWL characteristics; certain/uncertain equilibrium regions; electronic circuits; equilibrium regions; linear programming techniques; nonlinear circuit; real equilibrium points; spread characteristics; Aging; Circuit faults; Circuit testing; Diodes; Dispersion; Electronic circuits; Linear programming; Resistors; Temperature; Tolerance analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6685-9
Type
conf
DOI
10.1109/ISCAS.2001.921324
Filename
921324
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