Title :
On the testability of SC filters based on allpass sections
Author :
Cañive, Jorge M. ; Petraglia, Antornio
Author_Institution :
COPPE, Univ. Federal do Rio de Janeiro, Brazil
Abstract :
A methodology for testing switched-capacitor filters implemented by the parallel connection of allpass sections is presented. Mostly based on the analysis of frequency responses of second-order notch filters, the proposed approach enables clear fault detection and accurate estimation of the actually implemented parameter values. Simulation results are included to verify the functionality of the testing procedure
Keywords :
all-pass filters; analogue integrated circuits; fault location; frequency response; integrated circuit testing; notch filters; switched capacitor filters; SC filters; allpass sections; fault detection; filter testability; frequency responses; parallel connection; second-order notch filters; switched-capacitor filter testing; testing procedure; Analog integrated circuits; Automatic testing; Built-in self-test; Capacitance; Circuit testing; Costs; Filters; Frequency estimation; Integrated circuit testing; Operational amplifiers;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.921789
