Title :
Structural testing of pipelined analog to digital converters
Author :
Peralías, Eduardo J. ; Rueda, Adoración ; Huertas, José L.
Author_Institution :
Inst. de Microelectron., Seville Univ., Spain
Abstract :
This paper presents two alternative BIST schemes for structural testing of pipelined ADCs. The operational principle of both strategies relies on testing each of the ADC stages reconfigured as an A/D-D/A block and applying as input a set of analog values. These values are DC stimuli giving a simple output signature. The new techniques are intended for being used in pipelined converters of an arbitrary number of conversion stages and with a digital self-correction mechanism
Keywords :
analogue-digital conversion; built-in self test; integrated circuit testing; pipeline processing; redundancy; A/D-D/A block; BIST schemes; DC stimuli; analog valued input; arbitrary number of conversion stages; digital self-correction mechanism; hardware redundancy; operational principle; pipelined ADC; simple output signature; structural testing; Analog-digital conversion; Built-in self-test; Controllability; Costs; Electric variables measurement; Electrical fault detection; Performance evaluation; Production; Test equipment; Testing;
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.921886
