DocumentCode
1745174
Title
A robust DC current generation and measurement technique for deep submicron circuits
Author
Tam, Clarelice K L ; Roberts, Gordon W.
Author_Institution
Lab. of Microelectron. & Comput. Syst., McGill Univ., Montreal, Que., Canada
Volume
1
fYear
2001
fDate
6-9 May 2001
Firstpage
719
Abstract
A robust and highly scalable technique for generating and measuring DC currents is described. The circuits consist largely of digital electronics except for two simple passive filters and a comparator. This simple structure is able to force a current into a node and measure the corresponding node voltage, and vice versa. The technique has been successfully demonstrated using a prototype constructed using an FPGA chip
Keywords
constant current sources; electric current measurement; field programmable gate arrays; integrated circuit measurement; DC current generation; DC current measurement; FPGA chip; comparator; deep submicron circuit; digital electronics; node voltage; passive filter; Circuits; Current measurement; DC generators; Force measurement; Measurement techniques; Passive filters; Prototypes; Robustness; Semiconductor device measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6685-9
Type
conf
DOI
10.1109/ISCAS.2001.921957
Filename
921957
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