DocumentCode
174520
Title
Electro-thermal characterization of multi-emitter power NPN transistors
Author
Bajenaru, Adrian-Gabriel ; Boianceanu, Cristian Mihai ; Brezeanu, G.
Author_Institution
Infineon Technol. Romania, Romania
fYear
2014
fDate
22-24 May 2014
Firstpage
506
Lastpage
511
Abstract
This paper presents a method to characterize the electro-thermal behavior of power NPN transistors in the presence of temperature gradients that mimic the functioning conditions of the device in circuits like linear voltage regulators. A test structure able to generate the temperature variations over the power device and a measurement setup are presented. The entire structure is then modeled in a 3D thermal simulator and used to recreate the measurement conditions and explain the measured temperature profiles.
Keywords
power transistors; voltage regulators; 3D thermal simulator; circuits; electro-thermal characterization; linear voltage regulators; multi-emitter power NPN transistors; power device; temperature gradients; Current measurement; Heating; Resistors; Temperature measurement; Temperature sensors; Transistors; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Optimization of Electrical and Electronic Equipment (OPTIM), 2014 International Conference on
Conference_Location
Bran
Type
conf
DOI
10.1109/OPTIM.2014.6851018
Filename
6851018
Link To Document