DocumentCode :
1745328
Title :
Design on the turn-on efficient power-rail ESD clamp circuit with stacked polysilicon diodes
Author :
Ker, Ming-Dou ; Chen, Tung-Yang
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
4
fYear :
2001
fDate :
6-9 May 2001
Firstpage :
758
Abstract :
A novel power-rail ESD clamp circuit design by using stacked polysilicon diodes to trigger ESD protection device is proposed to achieve excellent on-chip ESD protection. Design methodology of this novel ESD clamp circuit has been derived in detail. Some controlled factors in the novel ESD clamp circuit can be exactly calculated to design a suitable ESD clamp circuit for different power supply applications. By adding this efficient power-rail ESD clamp circuit, the HBM ESD level of a CMOS IC product has been successfully improved from the original ~200 V to become ⩾3 kV
Keywords :
CMOS integrated circuits; electrostatic discharge; protection; semiconductor diodes; 3 kV; CMOS IC; HBM ESD level; Si; design methodology; on-chip ESD protection device; power-rail ESD clamp circuit; stacked polysilicon diodes; turn-on efficiency; Circuits; Clamps; Diodes; Electrostatic discharge; MOS devices; Parasitic capacitance; Protection; Rails; Variable structure systems; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
Type :
conf
DOI :
10.1109/ISCAS.2001.922348
Filename :
922348
Link To Document :
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