DocumentCode :
1745332
Title :
Analysis and experimental characterization of idle tones in 2nd-order bandpass ΣΔ modulators-a 0.8 μm CMOS switched-current case study
Author :
De la Rosa, José M. ; Perez-Verdu, Belen ; Medeiro, Fernando ; Río, Rocío Del ; Rodríguez-Vázquez, Angel
Author_Institution :
Inst. de Microelectron. de Sevilla, Spain
Volume :
4
fYear :
2001
fDate :
6-9 May 2001
Firstpage :
774
Abstract :
This paper analyses the tonal behaviour of the quantization noise in 2nd-order bandpass ΣΔ modulators. The analysis previously performed for lowpass modulators is extended to the bandpass case. As a result, closed-form expressions for the frequency of the idle tones are derived for different locations of the signal center frequency. The analytical results are validated through measurements from a silicon prototype realized using fully differential switched-current circuits in a standard 0.8 μm CMOS technology
Keywords :
CMOS integrated circuits; integrated circuit noise; quantisation (signal); sigma-delta modulation; switched capacitor networks; 0.8 micron; CMOS fully-differential switched-current circuit; Si; idle tone; quantization noise; second-order bandpass sigma-delta modulator; CMOS technology; Computer aided software engineering; Digital modulation; Feedback loop; Performance analysis; Prototypes; Quantization; Radio frequency; Silicon; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
Type :
conf
DOI :
10.1109/ISCAS.2001.922352
Filename :
922352
Link To Document :
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