Diffraction analysis of slanted finger interdigital transducers

Author

Martin, Guenter ; Chen, Dongpei

Author_Institution

Inst. for Solid State & Mater. Res., Dresden, Germany

Volume

1

fYear

2000

fDate

36800

Firstpage

167

Abstract

For analysis, Slanted Finger Interdigital Transducers (SFIT) are usually divided into many channels in parallel to the propagation direction. Every channel is considered to be a subfilter. This procedure neglects the diffraction completely. The present paper introduces the diffraction in the SFIT analysis by use of the Angular Spectrum of Plane Waves (ASPW) approach. The analysis is based on a one component bulk wave model. The model is used for analyzing a unidirectional SFIT filter, the transducers of which are composed of SPUDT cells on 37° YX quartz. The simulated transmission behavior is compared with experimental results. Good agreement is found

Keywords

acoustic wave diffraction; interdigital transducers; surface acoustic wave filters; 37 degree YX quartz; SPUDT cells; angular spectrum of plane waves approach; diffraction analysis; one component bulk wave model; simulated transmission behavior; slanted finger IDT; slanted finger interdigital transducers; unidirectional slanted finger IDT filter; Apertures; Band pass filters; Diffraction; Electrodes; Fingers; Passband; Reflection; Scattering; Transducers; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 2000 IEEE

Conference_Location

San Juan

ISSN

1051-0117

Print_ISBN

0-7803-6365-5

Type

conf

DOI

10.1109/ULTSYM.2000.922532

Filename

922532