DocumentCode :
1745389
Title :
Analysis of quartz and langasite STW device acceleration sensitivity
Author :
Kosinski, John A. ; Pastore, Robert A., Jr.
Author_Institution :
U.S. Army CECOM, Ft. Monmouth, NJ, USA
Volume :
1
fYear :
2000
fDate :
36800
Firstpage :
227
Abstract :
The acceleration sensitivity of STW on rotated Y-cut langasite is analyzed and compared to that of STW on rotated Y-cut quartz
Keywords :
accelerometers; lanthanum compounds; quartz; surface acoustic wave sensors; La3Ga5SiO14; STW device; SiO2; acceleration sensitivity; langasite; quartz; rotated Y-cut crystal; Acceleration; Circuit noise; Dielectric materials; Elasticity; Material properties; Oscillators; Piezoelectric devices; Q factor; Temperature; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2000 IEEE
Conference_Location :
San Juan
ISSN :
1051-0117
Print_ISBN :
0-7803-6365-5
Type :
conf
DOI :
10.1109/ULTSYM.2000.922545
Filename :
922545
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1745389
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