DocumentCode :
1745443
Title :
UV reflective modulation using SAWs with high amplitude
Author :
Schmidt, H. ; Franke, K. ; Hoeller, F. ; Martin, G. ; Ross-Messemer, M. ; Weihnacht, M.
Author_Institution :
Inst. for Solid State & Mater Res., Dresden, Germany
Volume :
1
fYear :
2000
fDate :
36800
Firstpage :
655
Abstract :
Light beam diffraction at high amplitude surface acoustic waves generated on piezoelectrical crystals enables us to construct new optical devices. The first order diffraction efficiency increases with decreasing light wavelength and in the UV range it becomes considerably for available high amplitudes. The generation of SAWs sufficiently high displacement amplitudes normal to the surface remains the chief problem due to the related power. For minimising these problems we had to choose proper crystals, orientations and IDT constructions. Special experimental techniques have been introduced to study high acoustic power effects on the sample: damaging of electrodes using SEM, temperature profiles on the sample surface by thermography. In addition, for the calibrated measurement of SAW amplitudes as a function of input power, we developed a novel optical probing method using two single mode light fibres. UV diffraction efficiencies up to 9% have been obtained for a 38°rot.ZX-LiNbO3 device corresponding to a SAW power of 10 W
Keywords :
acousto-optical modulation; light diffraction; lithium compounds; piezoelectric materials; reflectivity; surface acoustic waves; 10 W; 9 percent; IDT; LiNbO3; LiNbO3 crystal; SEM; UV reflective modulation; electrode damage; high amplitude surface acoustic wave; light beam diffraction; optical device; optical probe; piezoelectric crystal; single-mode light fibre; temperature profile; thermography; Acoustic beams; Acoustic diffraction; Acoustic waves; Amplitude modulation; Crystals; Optical diffraction; Optical surface waves; Sawing machines; Surface acoustic wave devices; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2000 IEEE
Conference_Location :
San Juan
ISSN :
1051-0117
Print_ISBN :
0-7803-6365-5
Type :
conf
DOI :
10.1109/ULTSYM.2000.922633
Filename :
922633
Link To Document :
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