Title :
MINVDD testing for weak CMOS ICs
Author :
Tseng, Chao-Wen ; Chen, Ray ; Nigh, Phil ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
A weak chip is one that contains flaws-defects that do not interfere with correct circuit operation at normal conditions but may cause intermittent or early-life failures. MINVDD testing can detect weak CMOS chips. The minvdd of a chip is the minimum supply voltage value at which a chip can function correctly. It can be used to differentiate between good chips and weak chips. In the first part of this paper, we will study several types of flaws to demonstrate the effectiveness of MINVDD testing. Experimental results show that MINVDD testing is as effective as VLV testing for screening out burn-in rejects. In the second part of this paper, we propose test conditions for low voltage testing, including test voltage, test timing and test sets. Experimental results are presented to validate our proposal
Keywords :
CMOS integrated circuits; failure analysis; flaw detection; integrated circuit reliability; integrated circuit testing; CMOS ICs; MINVDD testing; burn-in rejects; early-life failures; flaws; low voltage testing; minimum supply voltage value; test conditions; test sets; test timing; test voltage; weak chips; Acceleration; CMOS technology; Chaos; Circuit faults; Circuit testing; Delay; Low voltage; Manufacturing; Stress; Timing;
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
DOI :
10.1109/VTS.2001.923459
