DocumentCode :
1745750
Title :
Spatially resolved measurements of the microwave surface resistance of HTS thin films with a dielectric resonator design at 10.5 GHz and 77 K
Author :
Irgmaier, K. ; Ludsteck, A. ; Numssen, K. ; Kinder, H. ; Semerad, R.
Author_Institution :
Dept. of Phys., Tech. Univ. Munchen, Germany
fYear :
2000
fDate :
2000
Firstpage :
600
Lastpage :
603
Abstract :
We have developed and applied a method to measure the surface resistance of HTS films spatially resolved. To avoid high characterizing frequencies and to get an enhanced frequency stability we used a special parallel-plate resonator design. The system uses a stationary dielectric puck system and moves the HTS thin film sample over the open resonator, sampling the surface resistance at a frequency of 10.5 GHz. The spatial resolution of the prototype system is 9 mm. An adjustable coupling allows to measure the surface resistance in-situ as a function of the strength of the microwave magnetic field. We describe measurements of the spatial variation of linear and nonlinear effects in the surface resistance of YBa2Cu3O7 films at 77 K
Keywords :
barium compounds; dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; superconducting thin films; surface conductivity; yttrium compounds; 10.5 GHz; 77 K; HTS thin film; YBa2Cu3O7; dielectric puck; dielectric resonator; magnetic field; microwave surface resistance measurement; parallel-plate resonator; spatial resolution; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; Frequency; High temperature superconductors; Magnetic field measurement; Microwave measurements; Spatial resolution; Stability; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
Type :
conf
DOI :
10.1109/APMC.2000.925906
Filename :
925906
Link To Document :
بازگشت